Synchronizing sequences and symbolic traversal techniques in test generation Journal Article
Overview
publication date
- February 1, 1993
has restriction
- closed
Date in CU Experts
- April 15, 2014 11:29 AM
Full Author List
- Cho H; Jeong S-W; Somenzi F; Pixley C
author count
- 4
published in
- Journal of Electronic Testing Journal
Other Profiles
International Standard Serial Number (ISSN)
- 0923-8174
Electronic International Standard Serial Number (EISSN)
- 1573-0727
Digital Object Identifier (DOI)
Additional Document Info
start page
- 19
end page
- 31
volume
- 4
issue
- 1