Why is CuInSe2 tolerant to defects and what is the origin of ''ordered defect structures'' Conference Proceeding uri icon

Overview

publication date

  • November 18, 1996

Date in CU Experts

  • August 16, 2025 8:10 AM

Full Author List

  • Zunger A; Zhang SB; Wei SH

Full Editor List

  • Witt CE; AlJassim M; Gee JM

author count

  • 3

citation count

  • 0

Other Profiles

International Standard Serial Number (ISSN)

  • 0094-243X

International Standard Book Number (ISBN) 10

  • 1-56396-687-5

Additional Document Info

start page

  • 63

end page

  • 72

issue

  • 394