Point Defect Induced Potential Wells across the m-Plane of Core/Shell GaN Nanowires Journal Article uri icon

Overview

publication date

  • August 5, 2025

Date in CU Experts

  • August 6, 2025 6:41 AM

Full Author List

  • Rezaie S; Kusch G; Samuelson L; Wagner JB; Yazdi S

author count

  • 5

citation count

  • 0

Other Profiles

International Standard Serial Number (ISSN)

  • 1862-6254

Electronic International Standard Serial Number (EISSN)

  • 1862-6270