Analysis on the Adaptability of the International Radiation Immunity Test Method to Intelligent Connected Vehicle Conference Proceeding

Overview

CU Boulder Authors

Ding, Yifu

publication date

May 14, 2018

Date in CU Experts

January 19, 2025 8:19 AM

Full Author List

Ding Y; Zhang G; Zhang Z; Zhang X; Zhang Y

author count

5

citation count

0

presented at event

Joint 60th IEEE International Symposium on Electromagnetic Compatibility (EMC) / IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) Conference

Other Profiles

International Standard Serial Number (ISSN)

2158-110X