The Electric Field and Its Impact on the Pitch Angle of Trapped Electrons in a Sub-ion-scale Magnetic Hole Journal Article uri icon

Overview

publication date

  • November 1, 2024

has restriction

  • gold

Date in CU Experts

  • December 31, 2024 5:55 AM

Full Author List

  • Chen ZZ; Wang TY; Liu YY; Yu J; Wang J; Ye YD; Jiang YC; Fu HS; Cui J; Cao JB

author count

  • 11

citation count

  • 0

Other Profiles

International Standard Serial Number (ISSN)

  • 0004-637X

Electronic International Standard Serial Number (EISSN)

  • 1538-4357

Additional Document Info

volume

  • 976

issue

  • 1

number

  • ARTN 12