Thickness measurements of thin perfluoropolyether polymer films on silicon and amorphous-hydrogenated carbon with X-ray reflectivity, ESCA and optical ellipsometry Journal Article uri icon

Overview

publication date

  • May 1, 2000

has restriction

  • closed

Date in CU Experts

  • November 5, 2020 2:39 AM

Full Author List

  • Toney MF; Mate CM; Leach KA; Pocker D

author count

  • 4

citation count

  • 48

Other Profiles

International Standard Serial Number (ISSN)

  • 0021-9797

Electronic International Standard Serial Number (EISSN)

  • 1095-7103

Additional Document Info

start page

  • 219

end page

  • 226

volume

  • 225

issue

  • 1