Strain-induced interfacial hole localization in self-assembled quantum dots: Compressive InAs/GaAs versus tensile InAs/InSb Journal Article

Overview

CU Boulder Authors

zunger, alex

publication date

December 1, 2004

has restriction

closed

Date in CU Experts

September 3, 2013 3:28 AM

Full Author List

He LX; Bester G; Zunger A

author count

3

citation count

50

published in

Physical Review B Journal

Other Profiles

International Standard Serial Number (ISSN)

2469-9950

Electronic International Standard Serial Number (EISSN)

2469-9969

Digital Object Identifier (DOI)

https://doi.org/10.1103/physrevb.70.235316

Additional Document Info

volume

70

issue

23

number

ARTN 235316