A comparison of substrate noise coupling in lightly and heavily doped CMOS processes for 2.4-GHz LNAs Journal Article uri icon

Overview

publication date

  • March 1, 2006

has restriction

  • closed

Date in CU Experts

  • September 19, 2016 1:24 AM

Full Author List

  • Hazenboom S; Fiez TS; Mayaram K

author count

  • 3

citation count

  • 18

Other Profiles

International Standard Serial Number (ISSN)

  • 0018-9200

Electronic International Standard Serial Number (EISSN)

  • 1558-173X

Additional Document Info

start page

  • 574

end page

  • 587

volume

  • 41

issue

  • 3